STSM reports

First Year

Testing qualities of methodologies increasing reliability of digital systems
STSM Applicant: Mr Jan Kastil
STSM Host: Cristiana Bolchini (Politecnico di Milano)

Fault Tolerant Techniques for DSP and memories
STSM Applicant: Pedro Reviriego (University of Nebrija)
STSM Host: Chris Bleakley (University College Dublin)

Use of Advanced ECC code for low power caches
STSM Applicant: Salvatore Pontarelli
STSM Host: Pedro Reviriego (University of Nebrija)

Soft error-resistant cache coherence method
STSM Applicant: Mr Ibrahim Burak Karsli
STSM Host: Marco Ottavi (Università di Roma “Tor Vergata”)

Validation and Optimization of a Radiation-Tolerant Digital on-chip Measurement Infrastructure
STSM Applicant: Varadan Savulimedu Veeravalli (Vienna Univ. of Technology)
STSM Host: Lorena Anghel (TIMA Laboratory)

RTL Design and Test with HDLs
STSM Applicant: Petr Pfeifer
STSM Host: Maksim Jenihhin (Tallinn University of Estonia)

RTL Design and Test with HDLs Meeting with TUT on “Test Generation Driven by an Evolutionary Algorithm
STSM Applicant: Marco Gaudesi (Politecnico di Torino)
STSM Host: Maksim Jenihhin (Tallinn University of Estonia)

Use of Reed Solomon and BCH codes in last generation memories
STSM Applicant: Salvatore Pontarelli (Università di Roma “Tor Vergata”)
STSM Host: Valentin Gherman (CEA-LIST)

Design and Exploration of Advanced Thermal-Aware Many-Core Networks-on-Chip
STSM Applicant: Kameswar Rao Vaddina (NTNU)
STSM Host: Ioannis Sourdis (Chalmers University of Technology)

Post-Silicon Validation for High-performance microprocessors architectures
STSM Applicant: Nikos Foutris (University of Athens)
STSM Host: Amir Nahir (IBM Research)

System level design, on-line testing/fault tolerance
STSM Applicant: Masoumeh Ebrahimi (University of Turku)
STSM Host: Fabrizio Lombardi (Northeastern University)

Post silicon radiation test
STSM Applicant: Stefano Campitelli (Università di Roma “Tor Vergata”)
STSM Host: Alessandro Marchioro (CERN)

Optimizing Microprocessor Pipeline Stages for Reliability Improvement
STSM Applicant: Anteneh Bogale Gebregiorgis
STSM Host: Mehdi Tahoori (Karlsruhe Institute of Technology)

DRAM data retention time characterization of and study of TID effects
STSM Applicant: Angelo Bacchini
STSM Host: Gianluca Furano (ESTEC-ESA)

DRAM data retention time characterization of and study of TID effects
STSM Applicant: Hamzeh Ahangari
STSM Host: Prof. Osman Unsal (Barcelona Supercomputing Center)

Self-healing Processors on SRAM-based FPGAs
STSM Applicant: Cristiana Bolchini (Politecnico di Milano)
STSM Host: Mihalis Psarakis (University of Piraeus)

Implementation of self-healing processors on SRAM-based FPGAs
STSM Applicant: Antonio Miele (Politecnico di Milano)
STSM Host: Mihalis Psarakis (University of Piraeus)

Novel memristor circuits and applications
STSM Applicant: Marco Ottavi (Università di Roma “Tor Vergata”)
STSM Host: Dhiraj K. Pradhan (University of Bristol)

Hierarchical design accounting for time-dependent variability
STSM Applicant: Ben Kaczer (IMEC)
STSM Host: Shidhartha Das (ARM)

Fault Tolerant FPGA implementations, FPGA implementation of ECCs.
STSM Applicant: Mustafa Demirci (TOBB Economics and Technology University)
STSM Host: Pedro Reviriego (University of Nebrija)

Real-time Detection and Correction of Defective Pixels in Space Cameras
STSM Applicant: Ofer Hadar (Ben Gurion University of the Negev)
STSM Host: Israel Koren (Univ. of Massachusetts)

Improving reliability of SRAM-based FPGAs using relocatable modules
STSM Applicant: Mihalis Psarakis (University of Piraeus)
STSM Host: Cristiana Bolchini (Politecnico di Milano)

Explore memristor based photovoltaic array and evolving network
STSM Applicant: Yuanfan Yang (University of Bristol)
STSM Host: Marco Ottavi (Università di Roma “Tor Vergata”)

STT-RAM vs. ReRAM: a comparative study from device to circuit
STSM Applicant: Elena Ioana Vatajelu (Politecnico di Torino)
STSM Host: Said Hamdioui (Delft University)

Exploring memristive Sensor Systems and its Reliability Analysis
STSM Applicant: Jimson Mathew (University of Bristol)
STSM Host: Marco Ottavi (Università di Roma “Tor Vergata”)

Improving Soft Error Resiliency of SRAM-based FPGA Designs
STSM Applicant: Mustafa Demirci (ASELSAN Electronics Inc.)
STSM Host: Pedro Reviriego (University of Nebrija)

An advanced reliability driven dynamic mapping strategy in the dark silicon era
STSM Applicant: Mohammad-Hashem Haghbayan (University of Turku)
STSM Host: Antonio Miele (Politecnico di Milano)

Reliability Analysis of nanoscale technology nodes
STSM Applicant: MohammadSaber Golanbari (Karlsruhe Institute of Technology)
STSM Host: Praveen Raghavan (IMEC)

A Lifetime-Reliability-Aware Runtime Mapping Approach for Manycore Systems in the Dark Silicon Era
STSM Applicant: Antonio Miele (Politecnico di Milano)
STSM Host: Amir-Mohammad Rahmani (University of Turku)

Proactive Thermal Management for Multicore systems
STSM Applicant: Kameshwar Rao Vaddina (NTNU)
STSM Host: Jarmo Takala (TU Tampere)

Development of the Reliability Architect Tool
STSM Applicant: Panagiota Nikolaou (University of Cyprus)
STSM Host: (IRoC Technologies)

Defect avoidance techniques for nanoarrays of switching elements
STSM Applicant: Lorena Anghel (Grenble Institute of Technology)
STSM Host: Csaba Andras Moritz (Amherst University)