Day 1: Monday September 16
|
| Time |
Lecturer |
Topic |
| 09:30 – 11:00 |
Said Hamdioui |
Electronics in Nano-Era: Are We Facing a Reliability Wall? |
| 11:30 – 13:00 |
Ben Kaczer |
Advanced CMOS Devices and Reliability |
| 13:00 – 15:00 |
Lunch |
| 15:00 – 16:30 |
Ben Kaczer |
Advanced CMOS Devices and Reliability |
| 17:00 – 18:30 |
Shidhartha Das |
Sources of PVT Variations: Analysis and Modelling |
Day 2: Tuesday September 17
|
| 09:30 – 11:00 |
Israel Koren |
Introduction to Error detecting and correcting codes |
| 11:30 – 13:00 |
Shidhartha Das |
Variation Mitigation through Adaptive Computing |
| 13:00 – 15:00 |
Lunch |
| 15:00 – 16:30 |
Israel Koren |
Processor-level Fault Tolerance Techniques |
| 17:00 – 18:30 |
Vilas Sridharan |
DRAM Fault Modes: Learnings from Field Studies |
Day 3: Wednesday September 18
|
| 09:30 – 11:00 |
Viacheslav Izosimov |
Common measures for dependability evaluation |
| 11:30 – 13:00 |
Vilas Sridharan |
SER Modeling, Analysis, and Remediation in High-Performance Processors |
| 13:00 – 15:00 |
Lunch |
| 15:00 – 16:30 |
Viacheslav Izosimov |
Design optimization for fault tolerant distributed embedded systems |
| 17:00 – 18:30 |
Poster Session |
