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COST Action IC1103

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The First Workshop on Manufacturable and Dependable
Multicore Architectures at Nanoscale (MEDIAN'12)
Annecy, France, June 1st, 2012

Advanced Program

Time Event Description
08:00-08:30 Registration
08:30-08:45 Opening Remarks
08:45-09:15 Keynote Talk by Magdy S. Abadir
Achieving Reliable Zero-Defect Quality in an Unreliable World – Challenges and Potential Solutions
09:15 - 10:15 09:15-09:35 O1.1 A. Calimera, W. Liu, E. Macii, A. Nannarelli and M. Poncino
Power and Aging Characterization of Digital FIR Filters Architectures
09:35-09:55 O1.2 S. Khan and S. Hamdioui
Analyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates
09:55-10:15 O1.3 P. Guillaume, D. Bernard, G. Di Pendina and T. Kholdoun
Hybrid CMOS/Magnetic Process Design Kit and application to the design of reliable and low-power non-volatile logic circuits
10:15-10:30 Coffee Break
10:30 - 11:50 10:30-10:50 O2.1 C. Bolchini, M. Carminati and A. Miele
Towards the Design of Tunable Dependable Systems
10:50-11:10 O2.2 P. Rech, C. Aguiar, C. Frost and L. Carro
Neutrons-Induced Multiple Output Errors: a Reality on GPUs
11:10-11:30 O2.3 L. Chen and M. Tahoori
Soft Error Propagation and Correlation Estimation in Combinational Network
11:30-11:50 O2.4 P. Reviriego, C. Bleakely and J. A. Maestro
Low Complexity Concurrent Error Detection for Complex Multiplication
12:00-14:00 Lunch & Poster Session
12:00 - 14:00 P.1 M. Rozkovec, J. Jeníček and Z. Plíva
Using deterministic test vectors to test FPGA circuit
P.2 L. Guang, S. Asad, T. Yang, J. Plosila and H. Tenhunen
Embedding Fault-Tolerance with Dual-Level Agents in Many-Core Systems
P.3 I. Akturk and O. Ozturk
Reliability-Aware 3D Chip Multiprocessor Design
P.4 J. Kaštil, M. Straka and Z. Kotasek
Methodology for Increasing Reliability of FPGA Design via Partial Reconfiguration
P.5 V. S. Veeravalli and A. Steininger
Monitoring Single Event Transient Effects in Dynamic Mode
P.6 M. Šimková and J. Kaštil
Verification of Fault-tolerant Methodologies for FPGA systems
14:00-14:30 Invited Talk by Adrian Evans
Case Study of SEU Effects in a Network Processor
14:30 - 15:30 14:30-14:50 O3.1 S. Campagna and M. Violante
On the Evaluation of the Performance Overhead of a Commercial Embedded Hypervisor
14:50-15:10 O3.2 G. Theodorou, N. Kranitis, A. Paschalis and D. Gizopoulos
On-Line Software-Based Self-Test for Data TLBs
15:10-15:30 O3.3 M. A. Skitsas, C. A. Nicopoulos and M. K. Michael
Toward Selective Software-Based Self-Testing in Future Multi-Core Microprocessors
15:30-16:00 Closing remarks

Registration to the workshop available at: http://ets2012.imag.fr/ets/

General co-Chairs

  • Marco Ottavi
    University of Rome “Tor Vergata”
    ITALY
    E-mail: ottavi@ing.uniroma2.it
  • Massimo Violante
    Politecnico di Torino
    ITALY
    E-mail: massimo.violante@polito.it

Program co-Chairs

  • Said Hamidioui
    Delft University of Technology
    NETHERLANDS
    E-mail: s.hamdioui@tudelft.nl

  • Hans Manhaeve
    Ridgetop Europe
    BELGIUM
    E-mail: hans.manhaeve@qstar.be

Publicity Chair

  • Antonio Miele
    Politecnico di Milano
    ITALY
    E-mail: miele@elet.polimi.it